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Example 13.33 从生产电子元件的工艺过程中定期抽取容量为 50 的样本。, 其中可接受的不合格品率为 5%. 每个样本中不合格品数的逐次记录如下:
| 样例 i | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 | 12 | 13 | 14 | 15 | 16 | 17 | 18 | 19 | 20 |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Count | 3 | 5 | 2 | 2 | 1 | 6 | 4 | 4 | 2 | 6 | 7 | 4 | 4 | 5 | 8 | 6 | 9 | 7 | 9 | 8 |
| cW 或 cA | np 用于 cW | c 的 npA |
|---|---|---|
| 1.5 | <0.44 | <0.13 |
| 2.5 | 0.44–0.87 | 0.13–0.32 |
| 3.5 | 0.87–1.38 | 0.32–0.60 |
| 4.5 | 1.38–1.94 | 0.60–0.94 |
| 5.5 | 1.94–2.53 | 0.94–1.33 |
| 6.5 | 2.53–3.16 | 1.33–1.77 |
| 7.5 | 3.16–3.81 | 1.77–2.23 |
| 8.5 | 3.81–4.48 | 2.23–2.73 |
| 9.5 | 4.48–5.17 | 2.73–3.25 |
| 10.5 | 5.17–5.87 | 3.25–3.79 |
| 11.5 | 5.87–6.59 | 3.79–4.35 |
| 12.5 | 6.59–7.31 | 4.35–4.93 |
| 13.5 | 7.31–8.05 | 4.93–5.52 |
| 14.5 | 8.05–8.80 | 5.52–6.12 |
| 15.5 | 8.80–9.55 | 6.12–6.74 |
| 16.5 | 9.55–10.31 | 6.74–7.37 |
| 17.5 | 10.31–11.08 | 7.37–8.01 |
| 18.5 | 11.08–11.85 | 8.01–8.66 |
| 19.5 | 11.85–12.63 | 8.66–9.31 |
| 20.5 | 12.63–13.42 | 9.31–9.98 |
| 21.5 | 13.42–14.21 | 9.98–10.65 |
| 22.5 | 14.21–15.00 | 10.65–11.33 |
| 23.5 | 15.00–15.80 | 11.33–12.02 |
| 24.5 | 15.80–16.61 | 12.02–12.71 |
| 25.5 | 16.61–17.41 | 12.71–13.41 |
| 26.5 | 17.41–18.23 | 13.41–14.11 |
| 27.5 | 18.23–19.04 | 14.11–14.82 |
| 28.5 | 19.04–19.86 | 14.82–15.53 |
| 29.5 | 19.86–20.68 | 15.53–16.25 |
| 30.5 | 16.25–16.98 | |
| 31.5 | 16.98–17.70 | |
| 32.5 | 17.70–18.44 | |
| 33.5 | 18.44–19.17 | |
| 34.5 | 19.17–19.91 | |
| 35.5 | 19.91–20.66 |
Figure 13.37
休哈特属性控制限: n 是样本容量, p 是缺陷概率, cW 是警告限，且 cA 是行动限.